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RHD5911 fiches techniques PDF

Aeroflex Circuit Technology - Quad Comparator

Numéro de référence RHD5911
Description Quad Comparator
Fabricant Aeroflex Circuit Technology 
Logo Aeroflex Circuit Technology 





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RHD5911 fiche technique
Standard Products
RadHard-by-Design
Preliminary
RHD5911 Quad Comparator
Clocked
www.aeroflex.com/RHDseries
March 2, 2012
FEATURES
Single power supply operation at 3.3V or 5.0V
Radiation performance
- Total dose:
>1Mrad(Si); Dose rate = 50 - 300 rads(Si)/s
- ELDRS Immune
- SEL Immune
- Neutron Displacement Damage
>100 MeV-cm2/mg
>1014 neutrons/cm2
Ultra low power
Short Circuit Tolerant
Full military temperature range
Designed for aerospace and high reliability space applications
Packaging – Hermetic ceramic SOIC
- 16-pin, .411"L x .293"W x .090"Ht
- Weight - 0.8 grams max
Aeroflex Plainview’s Radiation Hardness Assurance Plan is DLA Certified to MIL-PRF-38534, Appendix G.
GENERAL DESCRIPTION
Aeroflex’s RHD5911 is a radiation hardened, single supply, quad clocked comparator in a 16-pin SOIC
package. The RHD5911 design uses specific circuit topology and layout methods to mitigate total ionizing
dose effects and single event latchup. These characteristics make the RHD5911 especially suited for the
harsh environment encountered in Deep Space missions. It is guaranteed operational from -55°C to
+125°C. Available screened in accordance with MIL-PRF-38534 Class K, the RHD5911 is ideal for
demanding military and space applications.
ORGANIZATION AND APPLICATION
The RHD5911 quad clocked comparator is intended for operation with dynamic signals on either or both
inputs. Comparison is ’clocked’, that is the circuit functions as a regenerative clocked latch with a digital
output. For slow input signals with small input differences the comparators can be expected to respond to
small noise signals at the inputs. Feedback hysteresis is the responsibility of the user to avoid ’chattering’
on system noise.
The comparators will accept signals from (GND + 0.8V) to VCC. The max clocked frequency is 50MHz.
The max clock-to-output delay is 10ns.
CMOS device drives have a negative temperature coefficient and the devices are therefore inherently
tolerant to momentary shorts, although on chip thermal shutdown is not provided. All inputs and outputs are
diode protected.
The devices will not latch with SEU events above 100 Mev-cm2/mg. Total dose degradation is minimal to
above 1Mrad(Si). Displacement damage environments to neutron fluence equivalents in the mid 1014
neutrons per cm2 range are readily tolerated. There is no sensitivity to low-dose rate (ELDRS) effects. SEU
effects are application dependant.
The RHD5911 16-pin clocked comparator allow pairs of comparators to access and hold data until needed.
SCD5911 Rev C

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