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LV8400V fiches techniques PDF

ON Semiconductor - Forward/Reverse Motor Driver

Numéro de référence LV8400V
Description Forward/Reverse Motor Driver
Fabricant ON Semiconductor 
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LV8400V fiche technique
Ordering number : ENA1385A
LV8400V
Bi-CMOS IC
Forward/Reverse Motor Driver
http://onsemi.com
Overview
The LV8400V is a 1-channel motor driver IC using D-MOS FET for output stage and operates in one of the four modes
under program control: forward, reverse, brake, and standby.
As the P/N-channel structure is used in the H-bridge output stage, the LV8400V features minimal number of external
component and low on-resistance (0.33typical). This IC is optimal for driving motors that need large-current.
Functions
1-channel forward/reverse motor driver
Low power consumption
Low output ON resistance 0.33Ω
Built-in constant current output circuit
Built-in low voltage reset and thermal shutdown circuit
Four mode function forward/reverse, brake, standby.
Specifications
Maximum Ratings at Ta = 25°C, SGND = PGND = 0V
Parameter
Power supply voltage (for load)
Symbol
VM max
Conditions
Ratings
-0.5 to 16.0
Unit
V
Power supply voltage (for control) VCC max
-0.5 to 6.0
V
Output current
IO max
IO peak1
IO peak2
IOUT max
DC
t 100ms, f = 5Hz
t 10ms, f = 5Hz
DC
1.2 A
2.0 A
3.8 A
30 mA
Input voltage
Allowable power dissipation
VIN max
Pd max
Mounted on a specified board *
-0.5 to VCC+0.5
800
V
mW
Operating temperature
Topr
-20 to +85
°C
Storage temperature
Tstg
-55 to +150
°C
* Specified board : 30mm × 50mm × 1.6mm, glass epoxy board.
Caution 1) Absolute maximum ratings represent the value which cannot be exceeded for any length of time.
Caution 2) Even when the device is used within the range of absolute maximum ratings, as a result of continuous usage under high temperature, high current,
high voltage, or drastic temperature change, the reliability of the IC may be degraded. Please contact us for the further details.
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating
Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability.
Semiconductor Components Industries, LLC, 2013
May, 2013
N3011 SY/D2408 MS 20081204-S00004 No.A1385-1/6

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