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PDF CD4018BMS Data sheet ( Hoja de datos )

Número de pieza CD4018BMS
Descripción CMOS Presettable Divide-By- N Counter
Fabricantes Intersil Corporation 
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No Preview Available ! CD4018BMS Hoja de datos, Descripción, Manual

CD4018BMS
November 1994
CMOS Presettable
Divide-By- “N” Counter
Features
Description
• High Voltage Type (20V Rating)
• Medium Speed Operation 10MHz (typ.) at VDD - VSS =
10V
• Fully Static Operation
• 100% Tested for Quiescent Current at 20V
• Standardized Symmetrical Output Characteristics
• 5V, 10V and 15V Parametric Ratings
• Maximum Input Current of 1µa at 18V Over Full Pack-
age-Temperature Range;
- 100nA at 18V and 25oC
• Noise Margin (Over Full Package Temperature Range):
- 1V at VDD = 5V
- 2V at VDD = 10V
- 2.5V at VDD = 15V
• Meets All Requirements of JEDEC Tentative Standard
No. 13B, “Standard Specifications for Description of
‘B’ Series CMOS Devices”
Applications
• Fixed and Programmable Divided- By-10, 9, 8, 7, 6, 5,
4, 3, 2 Counters
• Fixed and Programmable Counters Greater Than 10
• Programmable Decade Counters
• Divide-By- “N” Counters/Frequency Synthesizers
• Frequency Division
• Counter Control/Timers
CD4018BMS types consist of 5 Johnson-Counter stages,
buffered Q outputs from each stage, and counter preset con-
trol gating. CLOCK, RESET, DATA, PRESET ENABLE, and
5 individual JAM inputs are provided. Divide by 10, 8, 6, 4, or
2 counter configurations can be implemented by feeding the
Q5, Q4, Q3, Q2, Q1 signals, respectively, back to the DATA
input. Divide-by-9, 7, 5, or 3 counter configurations can be
implemented by the use of a CD4011B to gate the feedback
connection to the DATA input. Divide-by functions greater
than 10 can be achieved by use of multiple CD4018BMS
units. The counter is advanced one count at the positive
clock-signal transition. Schmitt Trigger action on the clock
line permits unlimited clock rise and fall times. A high
RESET signal clears the counter to an all-zero condition. A
high PRESET-ENABLE signal allows information on the JAM
inputs to preset the counter. Anti-lock gating is provided to
assure the proper counting sequence.
The CD4018BMS is supplied in these 16-lead outline pack-
ages:
Braze Seal DIP
Frit Seal DIP
Ceramic Flatpack
H4T
H1F
H6W
Functional Diagram
JAM INPUTS VDD
“2” “4”
“1” “3” “5”
2 3 7 9 12 16
Pinout
CD4018BMS
TOP VIEW
DATA 1
JAM 1 2
JAM 2 3
Q2 4
Q1 5
Q3 6
JAM 3 7
VSS 8
16 VDD
15 RESET
14 CLOCK
13 Q5
12 JAM 5
11 Q4
10 PRESET ENABLE
9 JAM 4
PRESET 10
ENABLE
CLOCK 14
DATA
1
RESET 15
5
Q1
4
Q2
6 Q3
11 Q4
13 Q5
8
VSS
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999
7-350
File Number 3298

1 page




CD4018BMS pdf
Specifications CD4018BMS
TABLE 5. BURN-IN AND LIFE TEST DELTA PARAMETERS +25OC
PARAMETER
SYMBOL
DELTA LIMIT
Output Current (Source)
IOH5A
± 20% x Pre-Test Reading
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUP
MIL-STD-883
METHOD
GROUP A SUBGROUPS
Initial Test (Pre Burn-In)
100% 5004
1, 7, 9
Interim Test 1 (Post Burn-In)
100% 5004
1, 7, 9
Interim Test 2 (Post Burn-In)
100% 5004
1, 7, 9
PDA (Note 1)
100% 5004
1, 7, 9, Deltas
Interim Test 3 (Post Burn-In)
100% 5004
1, 7, 9
PDA (Note 1)
100% 5004
1, 7, 9, Deltas
Final Test
100% 5004
2, 3, 8A, 8B, 10, 11
Group A
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroup B-6
Sample 5005
1, 7, 9
Group D
Sample 5005
1, 2, 3, 8A, 8B, 9
NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.
READ AND RECORD
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
Subgroups 1, 2, 3, 9, 10, 11
Subgroups 1, 2 3
CONFORMANCE GROUPS
Group E Subgroup 2
TABLE 7. TOTAL DOSE IRRADIATION
MIL-STD-883
METHOD
TEST
PRE-IRRAD
POST-IRRAD
5005
1, 7, 9
Table 4
READ AND RECORD
PRE-IRRAD
POST-IRRAD
1, 9 Table 4
TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS
OSCILLATOR
FUNCTION
Static Burn-In 1
Note 1
OPEN
4 - 6, 11, 13
GROUND
1 - 3, 7 - 9, 10, 12,
14, 15
VDD
16
9V ± -0.5V
50kHz
25kHz
Static Burn-In 2
Note 1
4 - 6, 11, 13
8 1 - 3, 7, 9, 10, 12,
14 - 16
Dynamic Burn-
In Note 1
-
2, 8, 9, 15
1, 3, 12, 16
4 - 6, 11, 13
7, 14
10
Irradiation
Note 2
4 - 6, 11, 13
8 1 - 3, 7, 9, 10, 12,
14 - 16
NOTE:
1. Each pin except VDD and GND will have a series resistor of 10K ± 5%, VDD = 18V ± 0.5V
2. Each pin except VDD and GND will have a series resistor of 47K ± 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures,
VDD = 10V ± 0.5V
7-354

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