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P3055LSG fiches techniques PDF

NIKO-SEM - N-Channel Field Effect Transistor

Numéro de référence P3055LSG
Description N-Channel Field Effect Transistor
Fabricant NIKO-SEM 
Logo NIKO-SEM 





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P3055LSG fiche technique
NIKO-SEM
N-Channel Logic Level Enhancement
Mode Field Effect Transistor
P3055LSG
TO-263
Lead Free
PRODUCT SUMMARY
V(BR)DSS
RDS(ON)
25 50m
ID
12A
D
G
S
1. GATE
2. DRAIN
3. SOURCE
ABSOLUTE MAXIMUM RATINGS (TC = 25 °C Unless Otherwise Noted)
PARAMETERS/TEST CONDITIONS
SYMBOL
Gate-Source Voltage
Continuous Drain Current
Pulsed Drain Current1
TC = 25 °C
TC = 100 °C
Avalanche Energy
Repetitive Avalanche Energy2
L = 0.1mH
L = 0.05mH
Power Dissipation
TC = 25 °C
TC = 100 °C
Operating Junction & Storage Temperature Range
Lead Temperature (1/16” from case for 10 sec.)
VGS
ID
IDM
EAS
EAR
PD
Tj, Tstg
TL
THERMAL RESISTANCE RATINGS
THERMAL RESISTANCE
SYMBOL
Junction-to-Case
RθJC
Junction-to-Ambient
RθJA
Case-to-Heatsink
RθCS
1Pulse width limited by maximum junction temperature.
2Duty cycle 1%
TYPICAL
0.6
LIMITS
±20
12
8
45
60
3
43
15
-55 to 150
275
UNITS
V
A
mJ
W
°C
MAXIMUM
2.6
60
UNITS
°C / W
ELECTRICAL CHARACTERISTICS (TC = 25 °C, Unless Otherwise Noted)
PARAMETER
SYMBOL
TEST CONDITIONS
Drain-Source Breakdown Voltage
Gate Threshold Voltage
Gate-Body Leakage
V(BR)DSS
VGS(th)
IGSS
STATIC
VGS = 0V, ID = 250µA
VDS = VGS, ID = 250µA
VDS = 0V, VGS = ±20V
LIMITS
UNIT
MIN TYP MAX
25
0.8 1.2 2.5
V
±250 nA
1 AUG-13-2004

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