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PDF AT28C17 Data sheet ( Hoja de datos )

Número de pieza AT28C17
Descripción 16K 2K x 8 CMOS E2PROM
Fabricantes ATMEL Corporation 
Logotipo ATMEL Corporation Logotipo



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No Preview Available ! AT28C17 Hoja de datos, Descripción, Manual

AT28C17
Features
Fast Read Access Time - 150 ns
•• Fast Byte Write - 200 µs or 1 ms
Self-Timed Byte Write Cycle
Internal Address and Data Latches
Internal Control Timer
Automatic Clear Before Write
Direct Microprocessor Control
DATA POLLING
READY/BUSY Open Drain Output
Low Power
30 mA Active Current
100 µa CMOS Standby Current
High Reliability
Endurance: 104 or 105 Cycles
Data Retention: 10 Years
5V ± 10% Supply
CMOS & TTL Compatible Inputs and Outputs
JEDEC Approved Byte Wide Pinout
•• Commercial and Industrial Temperature Ranges
Description
The AT28C17 is a low-power, high-performance Electrically Erasable and Program-
mable Read Only Memory with easy to use features. The AT28C17 is a 16K memory
organized as 2,048 words by 8 bits. The device is manufactured with Atmel’s reliable
nonvolatile CMOS technology.
Pin Configurations
(continued)
Pin Name
A0 - A10
CE
OE
WE
I/O0 - I/O7
RDY/BUSY
NC
DC
Function
Addresses
Chip Enable
Output Enable
Write Enable
Data Inputs/Outputs
Ready/Busy Output
No Connect
Don’t Connect
PDIP, SOIC
Top View
PLCC
Top View
16K (2K x 8)
CMOS
E2PROM
AT28C17
Note: PLCC package pins 1 and
17 are DON’T CONNECT.
0541A
2-183

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AT28C17 pdf
AC Read Characteristics
Symbol
tACC
tCE (1)
tOE (2)
tDF (3, 4)
tOH
Parameter
Address to Output Delay
CE to Output Delay
OE to Output Delay
CE or OE High to Output Float
Output Hold from OE, CE or
Address, whichever occurred first
AC Read Waveforms (1, 2, 3, 4)
AT28C17
AT28C17-15
Min Max
150
150
10 70
0 50
0
Units
ns
ns
ns
ns
ns
Notes: 1. CE may be delayed up to tACC - tCE after the address
transition without impact on tACC.
2. OE may be delayed up to tCE - tOE after the falling
edge of CE without impact on tCE or by tACC - tOE
after an address change without impact on tACC.
Input Test Waveforms and
Measurement Level
3. tDF is specified from OE or CE whichever occurs first
(CL = 5 pF).
4. This parameter is characterized and is not 100% tested.
Output Test Load
tR, tF < 20 ns
Pin Capacitance (f = 1 MHz, T = 25°C) (1)
Typ Max
CIN 4 6
COUT
8 12
Note: 1. This parameter is characterized and is not 100% tested.
Units
pF
pF
Conditions
VIN = 0V
VOUT = 0V
2-187

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