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PDF AT29C1024-12TC Data sheet ( Hoja de datos )

Número de pieza AT29C1024-12TC
Descripción 1 Megabit 64K x 16 5-volt Only CMOS Flash Memory
Fabricantes ATMEL Corporation 
Logotipo ATMEL Corporation Logotipo



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AT29C1024
Features
Fast Read Access Time - 70 ns
5-Volt-Only Reprogramming
•• Sector Program Operation
Single Cycle Reprogram (Erase and Program)
512 Sectors (128 words/sector)
Internal Address and Data Latches for 128 Words
Internal Program Control and Timer
Hardware and Software Data Protection
Fast Sector Program Cycle Time - 10 ms
DATA Polling for End of Program Detection
•• Low Power Dissipation
60 mA Active Current
200 µA CMOS Standby Current
Typical Endurance > 10,000 Cycles
•• Single 5V ±10% Supply
CMOS and TTL Compatible Inputs and Outputs
•• Commercial and Industrial Temperature Ranges
Description
The AT29C1024 is a 5-volt-only in-system Flash programmable and erasable read
only memory (PEROM). Its 1 megabit of memory is organized as 65,536 words by 16
bits. Manufactured with Atmel’s advanced nonvolatile CMOS technology, the device
offers access times to 70 ns with power dissipation of just 330 mW. When the device
is deselected, the CMOS standby current is less than 200 µA. The device endurance
is such that any sector can typically be written to in excess of 10,000 times.
(continued)
1 Megabit
(64K x 16)
5-volt Only
CMOS Flash
Memory
Pin Configurations
Pin Name
A0 - A15
CE
OE
WE
I/O0 - I/O15
NC
DC
Function
Addresses
Chip Enable
Output Enable
Write Enable
Data
Inputs/Outputs
No Connect
Don’t Connect
AT29C1024
PLCC Top View
TSOP Top View
Type 1
0571A
4-141

1 page




AT29C1024-12TC pdf
AT29C1024
AC Read Characteristics
AT29C1024-70 AT29C1024-90 AT29C1024-12 AT29C1024-15
Symbol Parameter
Min Max Min Max Min Max Min Max
tACC
Address to Output Delay
70
90 120 150
tCE (1) CE to Output Delay
70 90 120 150
tOE (2) OE to Output Delay
0 35 0 45 0 60 0 70
tDF (3, 4) CE or OE to Output Float
0
25
0
25
0
30
0
40
Output Hold from OE, CE
tOH or Address, whichever
0
0
0
0
occurred first
Units
ns
ns
ns
ns
ns
AC Read Waveforms (1, 2, 3, 4)
Notes: 1. CE may be delayed up to tACC - tCE after the address
transition without impact on tACC .
2. OE may be delayed up to tCE - tOE after the falling
edge of CE without impact on tCE or by tACC - tOE
after an address change without impact on tACC .
3. tDF is specified from OE or CE whichever occurs first
(CL = 5 pF).
4. This parameter is characterized and is not 100% tested.
Input Test Waveforms and
Measurement Level
Output Test Load
70 ns
90/120/150 ns
tR, tF < 5 ns
Pin Capacitance (f = 1 MHz, T = 25°C) (1)
Typ Max
CIN 4 6
COUT
8 12
Note: 1. This parameter is characterized and is not 100% tested.
Units
pF
pF
Conditions
VIN = 0V
VOUT = 0V
4-145

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AT29C1024-12TC arduino
AT29C1024
4-151

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