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Semtech Corporation - 500 MHz Pin Electronics Driver/ Window Comparator/ and Load

Numéro de référence E710AHF
Description 500 MHz Pin Electronics Driver/ Window Comparator/ and Load
Fabricant Semtech Corporation 
Logo Semtech Corporation 





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E710AHF fiche technique
EDGE HIGH-PERFORMANCE PRODUCTS
Description
Edge710
500 MHz Pin Electronics Driver,
Window Comparator, and Load
Features
The Edge710 is a totally monolithic ATE pin electronics
solution manufactured in a high-performance
complementary bipolar process. In Automatic Test
Equipment (ATE) applications, the Edge710 incorporates
a driver, a load, and a window comparator suitable for
very fast bidirectional channels in VLSI, Mixed-Signal, and
Memory test systems.
The three-statable driver is capable of generating 9V swings
over a 12V range. In addition, 13V super voltage may be
obtained under certain operating conditions. Separate
rise and fall edge adjustments support both high speed
and low speed applications, and allow for superior rise
and fall time matching. An input power down mode allows
extremely low leakage current in HiZ.
• Fully Integrated Three-Statable Driver, Window
Comparator, and Dynamic Active Load
• 12V Driver, Load, Compare Range
• 13V Super Voltage Capable
± 35 mA Programmable Load
• Comparator Input Tracking >6V/ns
• Leakage (L+D+C) < 1 µA (normal mode)
• Leakage (L+D+C) < 25 nA (IPD mode)
• Small footprint (52 pin MQFP)
Functional Block Diagram
The load supports programmable source and sink currents
of ± 35 mA over a 12V range, or it can be completely
disabled. The source current, sink current, and
commutating voltage are all independently set. In addition,
the load is configurable and may be used as a
programmable voltage clamp.
The window comparator spans a 12V common mode
range, tracks input signals with edge rates greater than 6
V/ns, and passes sub-ns pulses. An input power down
mode allows for extremely low leakage measurements.
The inclusion of all pin electronics building blocks into a
52 lead MQFP (10 mm body w/ internal heat spreader)
offers a highly integrated solution that is traditionally
implemented with multiple integrated circuits or discretes.
BIAS
DVH
DHI
DHI*
DVR_EN
DVR_EN*
DVL
IPD_D
QA*
QA
PECL
IPD_C
QB
QB*
Applications
• VLSI Test Equipment
• Mixed-Signal Test Equipment
• Memory Testers (Bidirectional Channels)
• ASIC Verifiers
ISC_IN
VCM_IN
VCM_OUT_A
VCM_OUT_B
ISK_IN
LD_EN
LD_EN*
RADJ
DOUT
FADJ
VCC
1K
1K
VEE
CVA
VINP
CVB
BRIDGE_SC
LOAD
BRIDGE_SK
Revision 2 / December 1, 2000
1
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