|
|
PDF 5962-87549012 Data sheet ( Hoja de datos )
| Número de pieza | 5962-87549012 | |
| Descripción | Microcircuit / Digital / Advanced CMOS / Quad 2 Input NAND Gate / Monolithic Silicon | |
| Fabricantes | National Semiconductor | |
| Logotipo |  |
|
Hay una vista previa y un enlace de descarga de 5962-87549012 (archivo pdf) en la parte inferior de esta página. Total 16 Páginas | ||
|
No Preview Available !
REVISIONS
LTR DESCRIPTION
A Change AC limits in table I. Add vendor CAGE 18714 to device type 01CX.
Editorial changes throughout.
DATE (YR-MO-DA)
87-11-16
B Changes in accordance with NOR 5962-R100-93.
93-03-23
C Changes in accordance with NOR 5962-R181-93.
93-06-25
D Add vendor CAGE F8859. Add device Class V criteria. Add delta limits, table III.
Add case outline X. Update boilerplate to MIL-PRF-38535 requirements. – lgt
01-03-23
E Add section 1.5, radiation features. Update the boilerplate to include radiation
hardness assured requirements. Editorial changes throughout. - TVN
03-10-01
APPROVED
R. R. Evans
Monica L. Poelking
Monica L. Poelking
Raymond Monnin
Thomas M. Hess
THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED.
CURRENT CAGE CODE 67268
REV
SHEET
REV
E
SHEET
15
REV STATUS
OF SHEETS
REV
SHEET
EEEEEEEEDDEEE E
1 2 3 4 5 6 7 8 9 10 11 12 13 14
PMIC N/A
PREPARED BY
Greg A. Pitz
STANDARD
MICROCIRCUIT
DRAWING
CHECKED BY
N. A. Hauck
APPROVED BY
N. A. Hauck
THIS DRAWING IS AVAILABLE
FOR USE BY ALL DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
DRAWING APPROVAL DATE
87-04-29
REVISION LEVEL
AMSC N/A
E
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216
http://www.dscc.dla.mil
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, QUAD
2-INPUT NAND GATE, MONOLITHIC SILICON
SIZE
A
SHEET
CAGE CODE
14933
1 OF 15
5962-87549
DSCC FORM 2233
APR 97
DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.
5962-E410-03
1 page  
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M.
3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.
3.2.3 Truth table. The truth table shall be as specified on figure 2.
3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3.
3.2.5 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 4.
3.2.6 Radiation exposure circuit. The radiation exposure circuit shall be maintained by the manufacturer under document
revision level control and shall be made available to the preparing or acquiring activity upon request.
3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the
electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full
case operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
tests for each subgroup are defined in table I.
3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be
marked as listed in MIL-HDBK-103. For packages where marking of the entire SMD PIN number is not feasible due to space
limitations, the manufacturer has the option of not marking the "5962-" on the device. For RHA product using this option, the
RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535.
Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A.
3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in
MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A.
3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535
listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of
compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see
6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this
drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of MIL-PRF-38535
and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.
3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for
device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing.
3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2
herein) involving devices acquired to this drawing is required for any change as defined in MIL-PRF-38535, appendix A.
3.9 Verification and review for device class M. For device class M, DSCC, DSCC's agent, and the acquiring activity retain
the option to review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made
available onshore at the option of the reviewer.
3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in
microcircuit group number 36 (see MIL-PRF-38535, appendix A).
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
E
5962-87549
SHEET
5
5 Page 
NOTES:
1. When measuring tPLH and tPHL: VTEST = open.
2. CL = 50 pF or equivalent (includes probe and jig capacitance).
3. RL = 500Ω or equivalent.
4. Input signal from pulse generator: VIN = 0.0 V to VCC; PRR ≤ 1 MHz; ZO = 50Ω; tr ≤ 3.0 ns; tf ≤ 3.0 ns; tr and tf shall be
measured from 10% of VCC to 90% of VCC and from 90% of VCC to 10% of VCC, respectively; duty cycle = 50 percent.
5. Timing parameters shall be tested at a minimum input frequency of 1MHz.
6. The outputs are measured one at a time with one transition per measurement.
FIGURE 4. Switching waveforms and test circuit.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
E
5962-87549
SHEET
11
11 Page | ||
| Páginas | Total 16 Páginas | |
| PDF Descargar | [ Datasheet 5962-87549012.PDF ] | |
Hoja de datos destacado
| Número de pieza | Descripción | Fabricantes |
| 5962-8754901 | Microcircuit / Digital / Advanced CMOS / Quad 2 Input NAND Gate / Monolithic Silicon |  ST Microelectronics |
| 5962-87549012 | Microcircuit / Digital / Advanced CMOS / Quad 2 Input NAND Gate / Monolithic Silicon | National Semiconductor |
| Número de pieza | Descripción | Fabricantes |
| SLA6805M | High Voltage 3 phase Motor Driver IC. |
 Sanken |
| SDC1742 | 12- and 14-Bit Hybrid Synchro / Resolver-to-Digital Converters. |
 Analog Devices |
|
DataSheet.es es una pagina web que funciona como un repositorio de manuales o hoja de datos de muchos de los productos más populares, |
| DataSheet.es | 2020 | Privacy Policy | Contacto | Buscar |