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TPC8028 fiches techniques PDF

Toshiba Semiconductor - Field Effect Transistor

Numéro de référence TPC8028
Description Field Effect Transistor
Fabricant Toshiba Semiconductor 
Logo Toshiba Semiconductor 





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TPC8028 fiche technique
TPC8028
TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (U-MOS IV)
TPC8028
Lithium Ion Battery Applications
Portable Equipment Applications
Notebook PC Applications
Unit: mm
Small footprint due to small and thin package
Low drain-source ON resistance: RDS (ON) = 3.5 m(typ.)
High forward transfer admittance: |Yfs| = 40 S (typ.)
Low leakage current: IDSS = 10 μA (max) (VDS = 30 V)
Enhancement mode: Vth = 1.3 to 2.5 V (VDS = 10 V, ID = 1 mA)
Absolute Maximum Ratings (Ta = 25°C)
Characteristics
Symbol
Rating
Unit
Drain-source voltage
Drain-gate voltage (RGS = 20 kΩ)
Gate-source voltage
Drain current
DC (Note 1)
Pulse (Note 1)
Drain power dissipation
(t = 10 s)
(Note 2a)
Drain power dissipation
(t = 10 s)
(Note 2b)
Single pulse avalanche energy
(Note 3)
Avalanche current
Repetitive avalanche energy
(Note 2a) (Note 4)
Channel temperature
Storage temperature range
VDSS
VDGR
VGSS
ID
IDP
PD
PD
EAS
IAR
EAR
Tch
Tstg
30
30
±20
18
72
1.9
1.0
84
18
0.066
150
55 to 150
Note 1, Note 2, Note 3 and Note 4: See the next page.
V
V
V
A
W
W
mJ
A
mJ
°C
°C
JEDEC
JEITA
TOSHIBA
2-6J1B
Weight: 0.08 g (typ.)
Circuit Configuration
8765
1234
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant
change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating
conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling
Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated
failure rate, etc).
This transistor is an electrostatic-sensitive device. Please handle with caution.
1 2007-04-23

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