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ON Semiconductor - PWM Current Control Stepping Motor Driver

Numéro de référence LV8727
Description PWM Current Control Stepping Motor Driver
Fabricant ON Semiconductor 
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LV8727 fiche technique
Ordering number : ENA1998
LV8727
Bi-CMOS LSI
PWM Current Control
Stepping Motor Driver
http://onsemi.com
Overview
The LV8727 is a PWM current-controlled micro step bipolar stepping motor driver. This driver can do eight ways of
micro step resolution of Half, 1/8, 1/16, 1/32, 1/64, 1/128, 1/10, 1/20 Step, and can drive simply by the step input.
Features
Single-channel PWM current control stepping motor driver.
Output on-resistance (upper side : 0.25Ω ; lower side : 0.15Ω ; total of upper and lower : 0.4Ω ; Ta = 25°C, IO = 4.0A)
Half, 1/8, 1/16, 1/32, 1/64, 1/128, 1/10, 1/20 Step are selectable.
Advance the excitation step with the only step signal input.
BiCDMOS process IC.
Available forward reverse control.
IO max=4.0A
Input pull down resistance
Thermal shutdown circuit.
With reset pin and enable pin.
Specifications
Absolute Maximum Ratings at Ta = 25°C
Parameter
Symbol
Conditions
Ratings
Unit
Supply voltage
Output current
Output peak current
Logic input voltage
VREF input voltage
VM max
IO max
IO peak
VIN max
VREF max
tw10ms, duty 20%
50 V
4A
4.6 A
6V
6V
MO / DOWN pin input voltage
Allowable power dissipation
VMO /VDOWN max
Pd max
Indipendent IC
6
2.45
V
W
Operating temperature
Topr
-30 to +85
°C
Storage temperature
Tstg
-55 to +150
°C
Caution 1) Absolute maximum ratings represent the value which cannot be exceeded for any length of time.
Caution 2) Even when the device is used within the range of absolute maximum ratings, as a result of continuous usage under high temperature, high current,
high voltage, or drastic temperature change, the reliability of the IC may be degraded. Please contact us for the further details.
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating
Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability.
Semiconductor Components Industries, LLC, 2013
June, 2013
N1611 SY 20111019-S00003 No.A1998-1/23

PagesPages 23
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