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ON Semiconductor - PWM Constant-Current Control Stepping Motor Driver

Numéro de référence LV8772
Description PWM Constant-Current Control Stepping Motor Driver
Fabricant ON Semiconductor 
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LV8772 fiche technique
Ordering number : ENA1975
LV8772
Bi-CMOS LSI
PWM Constant-Current Control
Stepping Motor Driver
http://onsemi.com
Overview
The LV8772 is a stepping motor driver, which is capable of micro-step drive and supports 4W 1-2 phase excitation. It
is stepping motors used in office equipment and amusement applications.
Features
Low on resistance (upper side : 0.3Ω ; lower side : 0.25Ω ; total of upper and lower : 0.55Ω ; Ta = 25°C, IO = 2.5A)
Excitation mode can be set to 2-phase, 1-2 phase, W1-2 phase , or 4W1-2 phase
BiCDMOS process IC
Excitation step proceeds only by step signal input
Motor current selectable in four steps
Output short-circuit protection circuit incorporated
Unusual condition warning output pins
No control power supply required
Specifications
Absolute Maximum Ratings at Ta = 25°C
Parameter
Supply voltage
Output peak current
Output current
Logic input voltage
MONI/EMO input voltage
Symbol
VM max
IO peak
IO max
VIN
Vmoni/Vemo
Conditions
tw 10ms, duty 20%
Allowable power dissipation
Operating temperature
Pd max1
Pd max2
Topr
1 unit
*
Storage temperature
Tstg
Ratings
36
3.0
2.5
-0.3 to +6
-0.3 to +6
3.0
5.4
-20 to +85
-55 to +150
Unit
V
A
A
V
V
W
W
°C
°C
* Specified circuit board : 90.0mm×90.0mm×1.6mm, glass epoxy 2-layer board, with backside mounting.
Caution 1) Absolute maximum ratings represent the value which cannot be exceeded for any length of time.
Caution 2) Even when the device is used within the range of absolute maximum ratings, as a result of continuous usage under high temperature, high current,
high voltage, or drastic temperature change, the reliability of the IC may be degraded. Please contact us for the further details.
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating
Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability.
Semiconductor Components Industries, LLC, 2013
June, 2013
90711 SY 20110902-S00001 No.A1975-1/17

PagesPages 17
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