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PDF IS45S32200C1 Data sheet ( Hoja de datos )

Número de pieza IS45S32200C1
Descripción SYNCHRONOUS DYNAMIC RAM
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IS45S32200C1
512K Bits x 32 Bits x 4 Banks (64-MBIT)
SYNCHRONOUS DYNAMIC RAM
ISSI®
JULY 2006
FEATURES
• Clock frequency: 143 MHz
• Fully synchronous; all signals referenced to a
positive clock edge
• Internal bank for hiding row access/precharge
• Single 3.3V power supply
• LVTTL interface
• Programmable burst length:
(1, 2, 4, 8, full page)
• Programmable burst sequence:
Sequential/Interleave
• Self refresh modes
• 4096 refresh cycles every 64 ms
• Random column address every clock cycle
• Programmable CAS latency (2, 3 clocks)
• Burst read/write and burst read/single write
operations capability
• Burst termination by burst stop and precharge
command
• Automotive Temperature Grade
Option A: 0oC to +70oC
Option A1: -40oC to +85oC
• Package 400-mil 86-pin TSOP II and 90-ball BGA
• Lead free package is available
OVERVIEW
ISSI's 64Mb Synchronous DRAM IS45S32200C1 is
organized as 524,288 bits x 32-bit x 4-bank for improved
performance. The synchronous DRAMs achieve high-
speed data transfer using pipeline architecture. All inputs
and outputs signals refer to the rising edge of the clock
input.
KEY TIMING PARAMETERS
Parameter
Clk Cycle Time
CAS Latency = 3
CAS Latency = 2
Clk Frequency
CAS Latency = 3
CAS Latency = 2
Access Time from Clock
CAS Latency = 3
CAS Latency = 2
-7
7
10
143
100
5.5
8
Unit
ns
ns
Mhz
Mhz
ns
ns
Copyright © 2006 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time
without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to
obtain the latest version of this device specification before relying on any published information and before placing orders for products.
Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774
Rev. B
05/18/06
1

1 page




IS45S32200C1 pdf
IS45S32200C1
ISSI ®
PIN FUNCTIONS
Symbol
A0-A10
Pin No.(TSOP)
25 to 27
60 to 66
24
Type
Input Pin
BA0, BA1
CAS
CKE
22,23
18
67
Input Pin
Input Pin
Input Pin
CLK 68 Input Pin
CS 20 Input Pin
DQ0 to 2, 4, 5, 7, 8, 10,11,13
DQ31 74,76,77,79,80,82,83,85
45,47,48,50,51,53,54,56
31,33,34,36,37,39,40,42
DQM0
DQM3
16,28,59,71
DQ Pin
Input Pin
RAS 19 Input Pin
WE 17 Input Pin
VDDQ
VDD
GNDQ
GND
3,9,35,41,49,55,75,81 Supply Pin
1,15,29,43
Supply Pin
6,12,32,38,46,52,78,84 Supply Pin
44,58,72,86
Supply Pin
Function (In Detail)
Address Inputs: A0-A10 are sampled during the ACTIVE
command (row-address A0-A10) and READ/WRITE command (A0-A7
with A10 defining auto precharge) to select one location out of the memory array
in the respective bank. A10 is sampled during a PRECHARGE command to
determine if all banks are to be precharged (A10 HIGH) or bank selected by
BA0, BA1 (LOW). The address inputs also provide the op-code during a LOAD
MODE REGISTER command.
Bank Select Address: BA0 and BA1 defines which bank the ACTIVE, READ,
WRITE or PRECHARGE command is being applied.
CAS, in conjunction with the RAS and WE, forms the device command. See the
"Command Truth Table" for details on device commands.
The CKE input determines whether the CLK input is enabled. The next rising edge
of the CLK signal will be valid when is CKE HIGH and invalid when LOW. When
CKE is LOW, the device will be in either power-down mode, clock suspend mode,
or self refresh mode. CKE is an asynchronous input.
CLK is the master clock input for this device. Except for CKE, all inputs to this
device are acquired in synchronization with the rising edge of this pin.
The CS input determines whether command input is enabled within the device.
Command input is enabled when CS is LOW, and disabled with CS is HIGH. The
device remains in the previous state when CS is HIGH.
DQ0 to DQ15 are DQ pins. DQ through these pins can be controlled in byte units
using the DQM0-DQM3 pins
DQMx control thel ower and upper bytes of the DQ buffers. In read mode,
the output buffers are place in a High-Z state. During a WRITE cycle the input data is
masked. When DQMx is sampled HIGH and is an input mask signal for write accesses
and an output enable signal for read accesses. DQ0 through DQ7 are controlled by
DQM0. DQ8 throughDQ15 are controlled by DQM1. DQ16 through DQ23 are
controlled by DQM2. DQ24 through DQ31 are controlled by DQM3.
RAS, in conjunction with CAS and WE, forms the device command. See the "Command
Truth Table" item for details on device commands.
WE, in conjunction with RAS and CAS, forms the device command. See the "Command
Truth Table" item for details on device commands.
VDDQ is the output buffer power supply.
VDD is the device internal power supply.
GNDQ is the output buffer ground.
GND is the device internal ground.
Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774
Rev. B
05/18/06
5

5 Page





IS45S32200C1 arduino
IS45S32200C1
ISSI ®
TRUTH TABLE – CURRENT STATE BANK n, COMMAND TO BANK m (1-6)
CURRENT STATE COMMAND (ACTION)
CS RAS CAS WE
Any
COMMAND INHIBIT (NOP/Continue previous operation)
HX XX
NO OPERATION (NOP/Continue previous operation)
LH HH
Idle Any Command Otherwise Allowed to Bank m
XX XX
Row ACTIVE (Select and activate row)
L L HH
Activating,
READ (Select column and start READ burst)(7)
LH LH
Active, or
WRITE (Select column and start WRITE burst)(7)
LH LL
Precharging
PRECHARGE
LL HL
Read
ACTIVE (Select and activate row)
L L HH
(Auto
READ (Select column and start new READ burst)(7,10)
LH LH
Precharge
WRITE (Select column and start WRITE burst)(7,11)
LH LL
Disabled)
PRECHARGE(9)
LL HL
Write
ACTIVE (Select and activate row)
L L HH
(Auto
READ (Select column and start READ burst)(7,12)
LH LH
Precharge
WRITE (Select column and start new WRITE burst)(7,13)
LH LL
Disabled)
PRECHARGE(9)
LL HL
Read
ACTIVE (Select and activate row)
L L HH
(With Auto
READ (Select column and start new READ burst)(7,8,14)
LH LH
Precharge)
WRITE (Select column and start WRITE burst)(7,8,15)
LH LL
PRECHARGE(9)
LL HL
Write
ACTIVE (Select and activate row)
L L HH
(With Auto
READ (Select column and start READ burst)(7,8,16)
LH LH
Precharge)
WRITE (Select column and start new WRITE burst)(7,8,17)
LH LL
PRECHARGE(9)
LL HL
NOTE:
1. This table applies when CKE n-1 was HIGH and CKE n is HIGH (Truth Table - CKE) and after tXSR has been met (if the previous
state was self refresh).
2. This table describes alternate bank operation, except where noted; i.e., the current state is for bank n and the commands shown
are those allowed to be issued to bank m (assuming that bank m is in such a state that the given command is allowable). Exceptions are
covered in the notes below.
3. Current state definitions:
Idle: The bank has been precharged, and tRP has been met.
Row Active: A row in the bank has been activated, and tRCD has been met. No data bursts/accesses and no register
accesses are in progress.
Read: A READ burst has been initiated, with auto precharge disabled, and has not yet terminated or been terminated.
Write: A WRITE burst has been initiated, with auto precharge disabled, and has not yet terminated or been terminated.
Read w/Auto
Precharge Enabled: Starts with registration of a READ command with auto precharge enabled, and ends when tRP has been met.
Once tRP is met, the bank will be in the idle state.
Write w/Auto
Precharge Enabled: Starts with registration of a WRITE command with auto precharge enabled, and ends when tRP has been
met. Once tRP is met, the bank will be in the idle state.
4. AUTO REFRESH, SELF REFRESH and LOAD MODE REGISTER commands may only be issued when all banks are idle.
5. A BURST TERMINATE command cannot be issued to another bank; it applies to the bank represented by the current state only.
6. All states and sequences not shown are illegal or reserved.
Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774
Rev. B
05/18/06
11

11 Page







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